Although electron microscopy can already reveal details as small as one nanometer, ongoing research seeks to break through barriers limiting image quality and reducing the optical dose on the samples.

Computer vision (CV) and image processing are two closely related fields that utilize techniques from artificial intelligence (AI) and pattern recognition to derive meaningful information from images, ...

Researchers at the Georgia Tech Research Institute recently combined machine learning, field-programmable gate arrays (FPGAs), graphics processing units (GPUs), and a novel radio frequency image ...

A project at Duke University has demonstrated how commercial AI models could accelerate microscopic examination of 2D materials and analysis of the results. The Duke Lab of Haozhe "Harry" Wang has ...

A new technical paper titled “Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review” was published by researchers at KU Leuven and imec. “In this ...

Ubicept said its novel approach is to use SPAD sensors with a new image-processing pipeline to improve the contrast and ...

Vision systems are rapidly becoming ubiquitous, driven by big improvements in image sensors as well as new types of sensors. While the sensor itself often is developed using mature-node silicon, ...

At this year’s Annual Meeting of the Radiological Society of North America (RSNA), Siemens Healthineers is presenting its new ...